Bruker Releases eWARP™ TKD and XFlash® FlatQUAD™ 2L

Milwaukee, Wisconsin based Bruker recently released two new detectors. The eWARP™ TKD (next-generation Transmission Kikuchi Diffraction detector with a 162 × 162 pixel sensor, up to 5,700 frames/second, and sub-2 nm resolution for nanoscale crystallography), and the XFlash® FlatQUAD™ 2L (annular EDS detector enabling simultaneous EDS and BSE detection for multimodal SEM analysis).

https://www.bruker.com/en/news-and-events/news/2026/bruker-announces-major-advances-in-detector-technology-for-semiconductor-thin-film-energy-materials-and-nanostructure-characterization.html