Milwaukee, Wisconsin based Bruker recently released two new detectors. The eWARP™ TKD (next-generation Transmission Kikuchi Diffraction detector with a 162 × 162 pixel sensor, up to 5,700 frames/second, and sub-2 nm resolution for nanoscale crystallography), and the XFlash® FlatQUAD™ 2L (annular EDS detector enabling simultaneous EDS and BSE detection for multimodal SEM analysis). https://www.bruker.com/en/news-and-events/news/2026/bruker-announces-major-advances-in-detector-

Gatan (AMETEK) recently release the F1-GIF™ System as a next-generation energy-filtered imaging and electron energy-loss spectroscopy (EELS). Gatan claims the F1-GIF™ delivers more than 4,000 eV of spectral coverage with sub-1 eV/channel sampling via a high-resolution direct detection sensor, while supporting low-dose performance and the full 30–300 kV TEM voltage range. The system may also enable integrated 5D STEM workflows for challenging materials while minimizing beam da

Waltham, MA based Thermo Fisher Scientific has released the EMPAD™ G2 direct electron detector for use in 4D STEM. Thermo Fisher claims the EMPAD™ G2 will enable faster high-speed 4D STEM imaging and analysis, and can be integrated with Velox software to be used in applications such as strain mapping, ptychography, and combined 4D STEM + EDS in materials research. https://www.thermofisher.com/us/en/home/electron-microscopy/products/accessories-em/empad-detector.html?cid=MSD_

Tokyo, Japan based JEOL released the GRAND ARM™ 3, the newest version of their 300 kV atomic-resolution analytical electron microscope. It is compatible with the LASCOR corrector for STEM, and the ATCOR corrector for TEM. On the same date, JEOL also launched the CRYO ARM™ 300S (300 kV), and CRYO ARM™ 200S (200 kV) cold field-emission cryo-electron microscopes. Geared for single-particle analysis (SPA), cryo-electron tomography (cryo-ET), and 3DED/MicroED, JEOL also claims the

Tokyo, Japan based JEOL has released the ACE eye™, a semiconductor-dedicated high-throughput analytical TEM. JEOL claims it is fully automated, recipe-based end-to-end operation, including TEM/STEM imaging and EDS analysis, and shifts from operator-dependent to operator-free measurements with high reproducibility. It features AI-driven automatic aberration correction (ASCOR as standard), advanced automation algorithms for continuous optimization of conditions, robust stabilit

The Brno, Czech Republic based Tescan announced the release of a new model of the CLARA™, an ultra-high resolution SEM with a boosting-type column and field free objective lens. Tescan claims this new version of the CLARA™ "advanced resolution performance", and appears mainly geared for materials science work. https://www.azonano.com/news.aspx?newsID=41775

JEOL has released an interesting new instrument, the LazEdge. Based on the IT-700 series schottky SEM, it includes a large laser attachment intended for large area, high speed cross-sectioning applications. JEOL also claims the laser milling to be much cleaner than the typical Gallium based FIB systems. https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/sales-launch-laser-sem-system-lazedge

Oberkochen, Germany based Zeiss has released the Crossbeam 750 FIB-SEM. This newest FIB features Gemini 4 optics and live SEM imaging while milling. https://www.zeiss.com/microscopy/en/about-us/newsroom/press-releases/2026/crossbeam-750.html

Tokyo, Japan based Hitachi High-Tech Corporation has recently released a new 120kV TEM, the HT7800II. Hitachi claims the system is extremely stable, high contrast system which takes Tungsten hairpin, or LaB6 filaments and can be run at 20 to 120kV in 100V steps. https://www.hitachi-hightech.com/us/en/news/nr20251219.html

Tokyo based Hitachi High-Tech Corporation recently released the SU9600, and Ultrahigh Resolution SEM. The newest in Hitachi's line of in-lens UHR-SEM's, the SU9600 claims SE resolution of 0.4nm @ 30kV (gap method), and 0.34nm @ 30kV lattice resolution in STEM mode. This instrument is highly specialized and often found in semiconductor manufacturing, or high end research laboratories. https://www.hitachi-hightech.com/us/en/news/nr20251031.html

Pennsylvania based Excelitas has recently released two new sCMOS cameras for light microscopes, and are designed for semiconductor and electronics inspection, as well as other metrology and materials science research needs. The pco.pixelfly 10 bi CLHS has a 10.4 MPixel sCMOS sensor, which is 4416 x 2368 pixels, and can capture full resolution up to 57 fps. The pco.pixelfly 26 CLHS has a 26 MPixel sCMOS sensor, which is 5120 x 5120 pixels, and can capture full resolution at up

Massachusetts based Bruker Corporation has recently released the VERTEX NEO Ultra, a benchtop sized Fourier Transform Infrared Spectrometer, which also runs under vacuum to reduce gaseous interference. The system boasts full automation features, as well as improved signal-to-noise over earlier models. https://www.bruker.com/en/news-and-events/news/2025/bruker-launches-the-vertex-neo-ultra.html

Austin, Texas based IXRF, Inc. has recently released the Atlas Apex M, and the Atlas Apex X microXRF systems. These systems have quick...

Thermo Fisher Scientific recently announced the latest iteration of the Talos line of TEM's, the Talos 12. This 120kV instrument is...

Thermo Fisher Scientific has recently released the latest iteration of the Scios line of FIB-SEM's, the Scios 3. Thermo Fisher claims the...

France based Digital Surf has recently released the latest version to its Mountains software. Some of the main improvements/additions...

Switzerland based Dectris has recently released the POLLUX, an XRD detector made for powder diffraction, reflectometry, spectrometry, and...

California based CRAIC Technologies recently released new software called Smart Merge, a module in their existing LambdaFire™ software ....

UK based Oxford Instruments has recently released a new large-sample Atomic Force Microscope (AFM) called the Jupiter Discovery. Oxford...

Waltham, Massachusetts based Thermo Fisher Scientific has released the Krios™ 5, a Cryo-Transmission Electron Microscope. Thermo Fisher...