Tokyo based Hitachi High-Tech Corporation recently released the SU9600, and Ultrahigh Resolution SEM. The newest in Hitachi's line of in-lens UHR-SEM's, the SU9600 claims SE resolution of 0.4nm @ 30kV (gap method), and 0.34nm @ 30kV lattice resolution in STEM mode. This instrument is highly specialized and often found in semiconductor manufacturing, or high end research laboratories. https://www.hitachi-hightech.com/us/en/news/nr20251031.html

Pennsylvania based Excelitas has recently released two new sCMOS cameras for light microscopes, and are designed for semiconductor and electronics inspection, as well as other metrology and materials science research needs. The pco.pixelfly 10 bi CLHS has a 10.4 MPixel sCMOS sensor, which is 4416 x 2368 pixels, and can capture full resolution up to 57 fps. The pco.pixelfly 26 CLHS has a 26 MPixel sCMOS sensor, which is 5120 x 5120 pixels, and can capture full resolution at up

Massachusetts based Bruker Corporation has recently released the VERTEX NEO Ultra, a benchtop sized Fourier Transform Infrared Spectrometer, which also runs under vacuum to reduce gaseous interference. The system boasts full automation features, as well as improved signal-to-noise over earlier models. https://www.bruker.com/en/news-and-events/news/2025/bruker-launches-the-vertex-neo-ultra.html

Austin, Texas based IXRF, Inc. has recently released the Atlas Apex M, and the Atlas Apex X microXRF systems. These systems have quick...

Thermo Fisher Scientific recently announced the latest iteration of the Talos line of TEM's, the Talos 12. This 120kV instrument is...

Thermo Fisher Scientific has recently released the latest iteration of the Scios line of FIB-SEM's, the Scios 3. Thermo Fisher claims the...

France based Digital Surf has recently released the latest version to its Mountains software. Some of the main improvements/additions...

Switzerland based Dectris has recently released the POLLUX, an XRD detector made for powder diffraction, reflectometry, spectrometry, and...

California based CRAIC Technologies recently released new software called Smart Merge, a module in their existing LambdaFire™ software ....

UK based Oxford Instruments has recently released a new large-sample Atomic Force Microscope (AFM) called the Jupiter Discovery. Oxford...

Waltham, Massachusetts based Thermo Fisher Scientific has released the Krios™ 5, a Cryo-Transmission Electron Microscope. Thermo Fisher...

Berlin, Germany based Bruker has released the new eWARP EBSD detector. Bruker claims this new detector, with its "hybrid pixel sensor and...

German microscope maker Zeiss has released a new light microscope system called the Lightfield 4D which can be integrated onto their LSM...

CRAIC Technologies from San Dimas, California, has released a new instrument solutions called "5D Spectral Surface Mapping ™ ". The point...

JEOL recently announced the release of two broad beam ion milling systems for SEM sample prep applications. The Cross Section Polisher...

Massachusetts based Bruker Corporation recently announced the release of the VERTEX NEO product line for vacuum FTIR. The first offering...

The UK based Oxford Instruments Nano Analysis has recently released the Ultim® Max ∞ (Infinity) EDS detector. The system is available...

Redding, California based Ted Pella, Inc. has recently released a new calibration standard for SEM/EDS and AFM. This standard features...

Freemont, California based JH Technologies has just announced that it will be distributing full sized Tungsten and Schottky sourced SEM's...

Ted Pella Inc. has recently released the new Cressington 208HRD sputter coater, designed specifically for high resolution SEM work. The...