JEOL Releases New Ion Mill for Sample Prep
- ERiC Jay Miller
- Feb 12
- 1 min read
JEOL recently announced the release of two broad beam ion milling systems for SEM sample prep applications. The Cross Section Polisher IB-19540CP works under ambient temperature, and the Cooling Cross Section Polisher IB-19550CCP has a LN2 cooling system attached.
JEOL claims a milling rate of 1.2mm per hour, and options for air-independent sample transfer, 8mm wide milling, and remote access.
