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The latest news concerning electron microscopes and their related industries and disciplines.
Electron Microscopy News


JEOL Releases GRAND ARM™ 3
Tokyo, Japan based JEOL released the GRAND ARM™ 3, the newest version of their 300 kV atomic-resolution analytical electron microscope. It is compatible with the LASCOR corrector for STEM, and the ATCOR corrector for TEM. On the same date, JEOL also launched the CRYO ARM™ 300S (300 kV), and CRYO ARM™ 200S (200 kV) cold field-emission cryo-electron microscopes. Geared for single-particle analysis (SPA), cryo-electron tomography (cryo-ET), and 3DED/MicroED, JEOL also claims the
5 hours ago


JEOL Releases New Automated TEM
Tokyo, Japan based JEOL has released the ACE eye™, a semiconductor-dedicated high-throughput analytical TEM. JEOL claims it is fully automated, recipe-based end-to-end operation, including TEM/STEM imaging and EDS analysis, and shifts from operator-dependent to operator-free measurements with high reproducibility. It features AI-driven automatic aberration correction (ASCOR as standard), advanced automation algorithms for continuous optimization of conditions, robust stabilit
Jul 31


JEOL Releases SEM-Laser System
JEOL has released an interesting new instrument, the LazEdge. Based on the IT-700 series schottky SEM, it includes a large laser attachment intended for large area, high speed cross-sectioning applications. JEOL also claims the laser milling to be much cleaner than the typical Gallium based FIB systems. https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/sales-launch-laser-sem-system-lazedge
May 30


JEOL Releases New Ion Mill for Sample Prep
JEOL recently announced the release of two broad beam ion milling systems for SEM sample prep applications. The Cross Section Polisher...
Feb 12, 2025


JEOL Releases New Atomic Resolution S/TEM
JEOL has released the new JEM-Z200MF MARS, an atomic resolution STEM/TEM. The new system boasts the new MARS system, which stands for...
Nov 16, 2024


JEOL Releases New UHR FE-SEM, JSM-IT810
JEOL has released a new version of their Ultra High Resolution Schottky Field Emission Scanning Electron Microscope, the JSM-IT810....
Aug 10, 2024


JEOL Releases New Compact 120keV TEM
It's not a washing machine, but a new compact 120keV TEM from JEOL. The JEM-120i is a compact TEM designed to fit into very small spaces....
May 30, 2024


JEOL Releases New Cryo FIB-SEM
Japan based JEOL has announced the new IB-Z200021CFS and IB-Z200022CPC cryo capable FIB-SEM's. The systems are designed to prepare frozen...
Mar 24, 2024
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