Tescan Installs 4D STEM on SEM
- 13 minutes ago
- 1 min read
Tescan, working in conjunction with the University of West Bohemia in Pilsen, Czech Republic, has installed a retractable 4D STEM detector onto an Amber 2 FIB-SEM.
This means that analyses such as diffraction, phase, and orientation can be performed on thin films and other materials research in the FIB-SEM without the need to transfer the sample to a TEM.
