At the Okazaki, Japan based Institute for Molecular Science, a team led by Hiroshi Daimon has developed an “atom-holography microscope” that combines a standard scanning electron microscope (SEM) beam with a new two-dimensional display-type analyzer (CoDELMA). The system records electron holograms and reconstructs them to reveal three-dimensional atomic arrangements in nanoscale regions without needing a transmission electron microscope or synchrotron radiation. Results were

The Brno, Czech Republic based Tescan announced the release of a new model of the CLARA™, an ultra-high resolution SEM with a boosting-type column and field free objective lens. Tescan claims this new version of the CLARA™ "advanced resolution performance", and appears mainly geared for materials science work. https://www.azonano.com/news.aspx?newsID=41775

Tescan, working in conjunction with the University of West Bohemia in Pilsen, Czech Republic, has installed a retractable 4D STEM detector onto an Amber 2 FIB-SEM. This means that analyses such as diffraction, phase, and orientation can be performed on thin films and other materials research in the FIB-SEM without the need to transfer the sample to a TEM. https://tescan.com/news/4d-stem-in-sem-materials-research-interview

The Maxim Prigozin Lab at Harvard University has recently presented their new imaging technique that combines SEM with CL imaging. Instead of imaging samples with tagged proteins in the SEM and CL systems separately and attempting to overlay the two datasets, they have instead tagged the proteins with probes that will fluoresce under an electron beam. This allows the researcher to simultaneously image the SE/BSE image with the CL image, giving very good spatial resolution, an

Researchers at the University of Victoria have developed a new ptychography-based imaging technique that achieves sub-angstrom resolution (0.67 Å) using a compact, low-energy scanning electron microscope. This is something that was only considered possible with very large, high-end transmission electron microscopes. This technique has the potential to make atomic scale imaging affordable enough for most people in the electron microscope field. https://news.uvic.ca/media-relea

Tokyo based Hitachi High-Tech Corporation recently released the SU9600, and Ultrahigh Resolution SEM. The newest in Hitachi's line of in-lens UHR-SEM's, the SU9600 claims SE resolution of 0.4nm @ 30kV (gap method), and 0.34nm @ 30kV lattice resolution in STEM mode. This instrument is highly specialized and often found in semiconductor manufacturing, or high end research laboratories. https://www.hitachi-hightech.com/us/en/news/nr20251031.html

Hitachi High-Tech America has opened an analytical laboratory in their Hillsboro, Oregon facility that is open for commercial use. The...

Redding, California based Ted Pella, Inc. has recently released a new calibration standard for SEM/EDS and AFM. This standard features...

Freemont, California based JH Technologies has just announced that it will be distributing full sized Tungsten and Schottky sourced SEM's...

Thermo Fisher has just released the new Apreo ChemiSEM Schottky SEM. This new system is an expansion of the original ChemiSEM, which is a...

Hitachi has released a new version of its popular TM4000 series of tabletop SEM's. The new instruments are called the TM4000III and...

JEOL has released a new version of their Ultra High Resolution Schottky Field Emission Scanning Electron Microscope, the JSM-IT810....

Here is a video about the goings on at M&M 2024 in Cleveland. We discuss the vendors, new products, what the hot topics were in the...

Hitachi High Tech has announced two new Schottky-sourced VP-SEM's. The SU3800SE and SU3900SE are Schottky versions of their...

Digital Surf is accepting entries to their Spring 3D View contest from April 15 thru May 31. Anyone with an image of a surface they have...

Japan based JEOL has announced the new IB-Z200021CFS and IB-Z200022CPC cryo capable FIB-SEM's. The systems are designed to prepare frozen...

Hitachi High-Tech has released the GT2000, an electron beam metrology system for the semiconductor industry. Hitachi claims the system is...

The new Zeiss Volutome is schottky-source SEM equipped with a Gemini 1 coulmn and an integrated ultramicrotome, making it possible to...

ModuleSci introduced the brand new PicoEye-100 Compact SEM. A tungsten filament SEM with a stated resolution of 3.0nm, a 5-axis motorized...