Improved Low-Energy EELS Elemental Analysis
Jul 30
1 min read
Researchers at Kyoto University’s Institute for Chemical Research, working with collaborators in Germany and Australia, demonstrated atomic-level elemental mapping using electron energy-loss spectroscopy (EELS) in the challenging low-energy regime (around 100 eV). By selectively detecting electrons scattered in specific directions, they achieved roughly five times higher spatial resolution for identifying silicon atoms, overcoming previous limitations caused by delocalized interactions. The work was published in Physical Review Letters around July 28–29, 2026.
