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The latest news concerning electron microscopes and their related industries and disciplines.
Electron Microscopy News


JEOL Releases GRAND ARM™ 3
Tokyo, Japan based JEOL released the GRAND ARM™ 3, the newest version of their 300 kV atomic-resolution analytical electron microscope. It is compatible with the LASCOR corrector for STEM, and the ATCOR corrector for TEM. On the same date, JEOL also launched the CRYO ARM™ 300S (300 kV), and CRYO ARM™ 200S (200 kV) cold field-emission cryo-electron microscopes. Geared for single-particle analysis (SPA), cryo-electron tomography (cryo-ET), and 3DED/MicroED, JEOL also claims the
5 hours ago


JEOL Releases New Automated TEM
Tokyo, Japan based JEOL has released the ACE eye™, a semiconductor-dedicated high-throughput analytical TEM. JEOL claims it is fully automated, recipe-based end-to-end operation, including TEM/STEM imaging and EDS analysis, and shifts from operator-dependent to operator-free measurements with high reproducibility. It features AI-driven automatic aberration correction (ASCOR as standard), advanced automation algorithms for continuous optimization of conditions, robust stabilit
Jul 31


Improved Low-Energy EELS Elemental Analysis
Researchers at Kyoto University’s Institute for Chemical Research, working with collaborators in Germany and Australia, demonstrated atomic-level elemental mapping using electron energy-loss spectroscopy (EELS) in the challenging low-energy regime (around 100 eV). By selectively detecting electrons scattered in specific directions, they achieved roughly five times higher spatial resolution for identifying silicon atoms, overcoming previous limitations caused by delocalized in
Jul 30


Hitachi Releases New HT7800 II 120kV TEM
Tokyo, Japan based Hitachi High-Tech Corporation has recently released a new 120kV TEM, the HT7800II. Hitachi claims the system is extremely stable, high contrast system which takes Tungsten hairpin, or LaB6 filaments and can be run at 20 to 120kV in 100V steps. https://www.hitachi-hightech.com/us/en/news/nr20251219.html
Jan 2


Hitachi Releases High Throughput Ultra-High-Rez SEM
Tokyo based Hitachi High-Tech Corporation recently released the SU9600, and Ultrahigh Resolution SEM. The newest in Hitachi's line of in-lens UHR-SEM's, the SU9600 claims SE resolution of 0.4nm @ 30kV (gap method), and 0.34nm @ 30kV lattice resolution in STEM mode. This instrument is highly specialized and often found in semiconductor manufacturing, or high end research laboratories. https://www.hitachi-hightech.com/us/en/news/nr20251031.html
Nov 22, 2025
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