JEOL Releases New Automated TEM
- 1 day ago
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Tokyo, Japan based JEOL has released the ACE eye™, a semiconductor-dedicated high-throughput analytical TEM. JEOL claims it is fully automated, recipe-based end-to-end operation, including TEM/STEM imaging and EDS analysis, and shifts from operator-dependent to operator-free measurements with high reproducibility. It features AI-driven automatic aberration correction (ASCOR as standard), advanced automation algorithms for continuous optimization of conditions, robust stability for long-term reliable use, an intuitive interface, and options for unattended operation and seamless FIB linkage. Key specifications include a cold field emission gun (60–200 kV), high resolutions (e.g., STEM ≤0.1 nm), and support for dual-axis tilting and various analysis options.
